The rapid evolution of 3D integrated circuits (3D-ICs) presents unprecedented opportunities in high-performance computing (HPC) and AI-driven systems-on-chip (SoCs). However, thermal challenges remain a critical factor affecting performance, reliability, and scalability.
Our latest white paper, "Thermal Analysis of 3D Stacking and BEOL Technologies with Functional Partitioning of Many-Core RISC-V SoC," dives deep into:
Our latest white paper, "Thermal Analysis of 3D Stacking and BEOL Technologies with Functional Partitioning of Many-Core RISC-V SoC," dives deep into:
- The impact of 3D integration on power density, heat dissipation, and performance
- Comparative analysis of EμBumps vs. wafer-to-wafer hybrid bonding (W2WHB) for 3D interconnects
- Functional partitioning strategies (Memory-on-Logic, Logic-on-Memory, and Logic-on-Logic) and their thermal implications
- Advanced power delivery solutions (frontside vs. backside PDN) and their role in mitigating thermal resistance
- Sensitivity analysis of material properties in 3D interface layers to optimize thermal performance